Abstract

NUNEZ GARCIA, Javier L. M et al. Morphology and crystalline quality assessment of single crystalline ZnSe. Rev. cienc. tecnol. [online]. 2014, n.21, pp.65-69. ISSN 1851-7587.

This project involves the study of the crystalline quality of a single crystalline commercial wafer of ZnSe (Cradley Crystals) combining different techniques. We use optical microscopy for the observation of macroscopic defects and etching figures which were obtained by chemical etching and transmission electron microscopy to determine the structural quality of the sample. We also measure the optical transmittance of the wafer due to its application as infrared window. The results show low presence of macroscopic defects, remarkable structural order between dislocations and small values of dislocation density and angular misorientation between adjacent subgrains. This confirms an adequate crystalline quality of the material as required for optoelectronic devices.

Keywords : ZnSe; TEM; FTIR; Chemical etching.

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