Resumo

VIDAL, R. A et al. Growth, thermal desorption and ion bombardment damage inC₆₀films deposited on Cu(111). An. AFA [online]. 2016, vol.27, n.2, pp.67-72. ISSN 0327-358X.

Auger Electron Spectroscopy (AES) and Low Energy Electron Diffraction (LEED) were used to characterize the growth and thermal desorption of C₆₀ on Cu(111). C₆₀ films were grown by sublimation from a Knudsen cell at 350°C, placed in an ultra-high vacuum chamber (UHV) (~10^-9 Torr). We estimated the best conditions to obtain low energy ion scattered spectra (LEIS) by measuring the irradiation damage produced by typical doses used in theseexperiments (~10¹⁴ iones/cm²). In order to analyze the potential damage of the sample by ion bombardment (2 , 4 and 8 keV H⁺, He⁺ and Ar⁺), we monitored the evolution of the characteristicplasmon due to π-bonds of the C₆₀ molecule C atoms by Electron Energy Loss Spectroscopy (EELS). In addition, Auger spectra (AES) were taken before and after irradiation to characterize and quantify the damage. Our study shows that: C₆₀ growths on Cu(111) layer by layer; the desorption of the first monolayer is different to the desorption of the other layers, remaining the first monolayer even when the substrate is heated up to 500°C and; damage by ion bombardment, at the used dose, was only detected when the sample was under Ar⁺ irradiation.

Palavras-chave : Thermal desorption; C₆₀; Cu(111); Ion bombardment; AES; EELS; LEED; LEIS.

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